(MMF)
MICROSCOPY AND MICROANALYSIS FACILITY
MMF houses a broad range of advanced microanalysis instrumentation providing high quality chemical, mineralogical and microstructural information, and high resolution images for research and technical publications. The facility staff have expertise in Materials and Earth Science research which is used to support both academic research and applied projects for the Western Australian minerals and energy sector.


HIGH QUALITY MICROSTRUCTURAL ANALYSIS OF CHALLENGING, COMPLEX SAMPLES BY HIGHLY TRAINED EXPERTS

TECHNIQUES/CAPABILITIES

SEM

High resolution imaging with secondary electrons (SE), backscattered electrons (BSE) and cathodoluminescence (CL)

Panorama imaging in SE, BSE and CL modes

Qualitative and quantitative energy-dispersive x-ray spectroscopy (EDS) elemental analysis

Electron backscattered diffraction (EBSD) for phase and orientation analysis

Large area mapping (LAM) for EDS and EBSD

Transmission Kikuchi Diffraction (TKD)

Ga+ Focused Ion Beam (FIB) sample manipulation for sectioning, in-situ lift-out and 3D imaging (via FIB Facility)

Variable pressure (VP) imaging of delicate/uncoated/moist samples

Light microscopy, including low magnification stereomicroscopy

Sample preparation equipment including carbon and platinum coaters

Mounting/polishing equipment (via DMH)

TEM

Atomic lattice imaging

STEM imaging in HAADF, BF and DF modes

Qualitative and quantitative energy-dispersive x-ray spectroscopy (EDS) elemental analysis

Single tilt and low background double tilt holders

TEM, STEM and EDS tomography

Electron diffraction by SAD and CBED

MIRA VP-FESEM

The Mira3 is a variable pressure field emission scanning electron microscope (VP-FESEM) that features sensitive EDS and EBSD detectors and integrated software for high quality microstructural analysis of crystalline samples.

NEON FIB-SEM

The Neon is a dual-beam field emission scanning electron microscope (FESEM). This instrument combines high resolution imaging with energy dispersive x-ray spectrometry (EDS) and electron backscattered diffraction (EBSD).

EVO SEM

The Evo is a variable pressure scanning electron microscope (VP-SEM). The microscope is suitable for general purpose microstructural analysis at high vacuum, or for the analysis of non-conductive/hydrated samples at lower vacuum.

FEI TALOS FS200X G2 FEG TEM

The FEI Talos field emission gun (FEG) transmission electron microscope (TEM) is built on an advanced operating platform for atomic lattice resolution imaging and nanoscale microanalysis. The TEM is equipped with highly sensitive Super-X EDS detectors for elemental analysis. This instrument is capable of 3D tomography investigations in all modes of operation (TEM, STEM & EDS).

SAMPLE PREPARATION LABORATORY

The MMF has a suite of equipment that includes coaters and desiccator systems that are used to prepare samples for electron microscopy. It also has access to vacuum mounting and automated polishers (via DMH) and mills (via XRDSF).

LIGHT MICROSCOPY LABORATORY

The MMF has a dedicated light microscopy laboratory with a Nikon ME600 light microscope and a Nikon SMZ800 stereo microscope. There is also a computer with image analysis software.

APPLICATIONS

Collaborative research, training and education, consultancy

Earth Science

• Quantification of sample microstructure and mineralogy

• High resolution EDS and EBSD mapping of geological samples

• Characterisation of crystallographic preferred orientations in deformed minerals

• Formation and deformation of ore minerals and ore bodies

Materials Science

• Characterisation of crystallographic texture and orientation

• Analysis of morphology, particle size and porosity

• Fracture and damage analysis

Chemical Science

• High resolution imaging and chemical analysis of electrodes, nano-particles and reaction products

• Crystallographic analysis of complex synthetic samples

Life Science

• Microstructural analysis of hydrated, fragile and biological samples

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ACCESS TO MMF

1. Registration

To register or enquire about rates please contact MMF via email.

2. Access to EM

Curtin staff/students and associates
There is a Registration Fee for all new users, which also covers a new user meeting to discuss your access requirements and appropriate sample preparation. It is compulsory to attend the MMF Induction if you will be using the Preparation Laboratory or any of the instruments unsupervised. After completing training, regular users can book MMF instruments via our online booking system; irregular users will need to email us to arrange a suitable time when they, a technician and the instrument are available.

All other users
Please email us to discuss your access.

3. Publications and Acknowledgement

When you publish material containing results acquired from MMF instrumentation you are required to: (1) include the standard acknowledgement, found in our User Regulations, in all publications featuring data/images collected in MMF, and (2) email us a copy of the publication(s).

Dr. Zakaria Quadir
MMF
Facility Leader
Ph: +61 8 9266 1026
Ms. Elaine Miller
MMF-XRDSF
MMF Laboratory Manager
Ph: +61 8 9266 7511
Dr. William Richard
Dual-Beam FIB
FIB Facility Leader
Ph: +61 8 9266 7943
Ms. Veronica Avery
MMF-SEM-sample preparation
Technical Officer
Ph: +61 8 9266 7844
Prof. Arie van Riessen
MMF
Adjunct Professor
Ph: +61 8 9266 7090
Ms. Kelly Merigot
MMF-TEM-Sample preparation
Technical Officer
Ph: +61 8 9266 7511
MMF staff
MMF
General Inquiries
Ph: +61 8 9266 7511
Download FEG TEM Flyer
Download MIRA3 VP-FESEM Flyer
Download EVO SEM Flyer
Download LYRA3 FIBSEM Flyer
Download NEON CROSS-BEAM FESEM Flyer